Hostname: page-component-586b7cd67f-dlnhk Total loading time: 0 Render date: 2024-11-25T13:45:25.657Z Has data issue: false hasContentIssue false
  • English
  • Français

Towards Nanometer-Scale Three-Dimensional Magnetic Studies with Atomic Size Electron Vortex Beams

Published online by Cambridge University Press:  01 August 2018

Jan Rusz ,
Devendra Negi ,
Lewys Jones  and
Juan-Carlos Idrobo
Jan Rusz
Affiliation:
Department of Physics and Astronomy, Uppsala University, Uppsala, Sweden
Devendra Negi
Affiliation:
Department of Physics and Astronomy, Uppsala University, Uppsala, Sweden
Lewys Jones
Affiliation:
School of Physics, Trinity College Dublin, Dublin 2, Ireland Advanced Microscopy Laboratory, Centre for Research on Adaptive Nanostructures and Nanodevices, Dublin 2, Ireland
Juan-Carlos Idrobo
Affiliation:
Center of Nanophase Materials Sciences, Oak Ridge National Laboratory, Oak Ridge, TN 37831, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 918 - 919
Copyright
© Microscopy Society of America 2018 

References

[1] Schattschneider, P., et al, Nature 441, 486 2006.Google Scholar
[2] Idrobo, J. C., et al, Advanced Chemical and Structural Imaging 2, 5 2016.Google Scholar
[3] Rusz, J., et al, Nature Communications 7, 12672 2016.Google Scholar
[4] Thersleff, T., Rusz, J., Hjôrvarsson, B. Leifer, K. Physical Review B 94, 134430 2016.Google Scholar
[5] Wang, Z., et al, Nature Materials 2018. doi: 10.1038/s41563-017-0010-4.Google Scholar
[6] Krivanek, O., et al, Microscopy and Microanalysis 20, 832 2014.Google Scholar
[7] Rusz, J. Ultramicroscopy 177, 20 2017.Google Scholar
[8] Nellist, P.D., et al, Microscopy and Microanalysis 14, 82 2008.Google Scholar
[9] Jones, L., et al, Microscopy 2018. doi: 10.1093/jmicro/dfx125.Google Scholar
[10] Support from Swedish Research Council, Gôran Gustafssons foundation, Carl Tryggers foundation and SNIC (NSC Center) is gratefully acknowledged. JCI acknowledges support from the Center for Nanophase Materials Sciences, which is a DOE Office of Science User Facility.Google Scholar