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Towards Identification of Oxygen Point Defects by Means of Position Averaged CBED

Published online by Cambridge University Press:  23 September 2015

R. dos Reis ,
C. Ophus ,
J. Ciston ,
P. Ercius  and
U. Dahmen
R. dos Reis
Affiliation:
National Center for Electron Microscopy/Molecular Foundry, LBNL, Berkeley, CA 94720, USA
C. Ophus
Affiliation:
National Center for Electron Microscopy/Molecular Foundry, LBNL, Berkeley, CA 94720, USA
J. Ciston
Affiliation:
National Center for Electron Microscopy/Molecular Foundry, LBNL, Berkeley, CA 94720, USA
P. Ercius
Affiliation:
National Center for Electron Microscopy/Molecular Foundry, LBNL, Berkeley, CA 94720, USA
U. Dahmen
Affiliation:
National Center for Electron Microscopy/Molecular Foundry, LBNL, Berkeley, CA 94720, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1097 - 1098
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] LeBeau, J M, et al., Ultramicroscopy 110, p 118 (2010).Google Scholar
[2] Erhart, P., et al, Phys. Rev. B 73, 205203 (2006).Google Scholar
[3] Ophus, C., et al, Acta Cryst A 70, C1455 (2014).Google Scholar
[4] Work at the NCEM/Molecular Foundry was supported by the Office of Science, Office of Basic Energy Sciences, of the U.S. Department of Energy under Contract No. DE-AC02-05CH11231. RR acknowledges the support of CAPES/BR foundation Process No. 1204713-9 and thanks Dr. D.L. Baptista and Dr. C.I.L. Sombrio for providing ZnO nanowires for this study.Google Scholar