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Towards a High-Brightness Electron Impact Ion Source for Nano-Applications
Published online by Cambridge University Press: 28 September 2015
Abstract
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- Type
- Ion Optics
- Information
- Microscopy and Microanalysis , Volume 21 , Supplement S4: Proceedings Ninth International Conference on Charged Particle Optics , June 2015 , pp. 94 - 99
- Copyright
- Copyright © Microscopy Society of America 2015
References
References:
[1]Introduction to Focused Ion Beams", ed. Giannuzzi, LA & Stevie, FA, (Springer, New York.Google Scholar
[5]Migeon, HN, et al, Int. J. Mass Spectrom. Ion Processes 143 (1995). p., 51.CrossRefGoogle Scholar
[9] SIMION 3D version 8.1; Scientific Instrument. Services, Inc.Google Scholar
[13]Mark, TD in Electron Ionization (ed. TD Mark & GH Mark, (Innsbruck Uni. Press. p. 137.Google Scholar
[15] This work is supported by the Fonds National de la Recherche, Luxembourg (AFR-Grant 5944057).Google Scholar
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