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Towards a High-Brightness Electron Impact Ion Source for Nano-Applications

Published online by Cambridge University Press:  28 September 2015

Olivier De Castro
Affiliation:
Department “Science and Analysis of Materials“ (SAM), Centre de Recherche Public - Gabriel Lippmann, Belvaux, Luxembourg.
David Dowsett
Affiliation:
Department “Science and Analysis of Materials“ (SAM), Centre de Recherche Public - Gabriel Lippmann, Belvaux, Luxembourg.
Tom Wirtz
Affiliation:
Department “Science and Analysis of Materials“ (SAM), Centre de Recherche Public - Gabriel Lippmann, Belvaux, Luxembourg.
Serge Della Negra
Affiliation:
Institut de Physique Nucléaire Orsay (IPNO), Université Paris Sud, Orsay, France.

Abstract

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Type
Ion Optics
Copyright
Copyright © Microscopy Society of America 2015 

References

References:

[1]Introduction to Focused Ion Beams", ed. Giannuzzi, LA & Stevie, FA, (Springer, New York.Google Scholar
[2]Tseng, AA, Small 1 (2005). p 924.Google Scholar
[3]Giannuzzi, LA & Stevie, FA, Micron 30 (1999). p. 197.CrossRefGoogle Scholar
[4]Economou, NP, et al, Scanning 34 (2012). p. 83.CrossRefGoogle Scholar
[5]Migeon, HN, et al, Int. J. Mass Spectrom. Ion Processes 143 (1995). p., 51.CrossRefGoogle Scholar
[6]Tondare, VN, J. Vac. Sci. Technol. A 23 (2005). p. 1498.CrossRefGoogle Scholar
[7]Nier, AO, Rev. Sci. Instrum. 18 (1947). p. 398.CrossRefGoogle Scholar
[8]Barth, JE, et al, Microelectronic Eng 3 (1985). p. 147.CrossRefGoogle Scholar
[9] SIMION 3D version 8.1; Scientific Instrument. Services, Inc.Google Scholar
[10]Dowsett, D this proceedings.Google Scholar
[11]Yamamoto, S, Rep. Prog. Phys 69 (2006). p. 181.CrossRefGoogle Scholar
[12]Rejoub, R, et al, Phys. Rev. A 65 (2002), 042713.CrossRefGoogle Scholar
[13]Mark, TD in Electron Ionization (ed. TD Mark & GH Mark, (Innsbruck Uni. Press. p. 137.Google Scholar
[14]Smith, NS, et al, Appl. Surf. Sci 255 (2008). p. 1606.CrossRefGoogle Scholar
[15] This work is supported by the Fonds National de la Recherche, Luxembourg (AFR-Grant 5944057).Google Scholar