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Toward the Atomic-Level Mass Analysis of Biomolecules by the Scanning Atom Probe

Published online by Cambridge University Press:  22 December 2016

Osamu Nishikawa  and
Masahiro Taniguchi
Osamu Nishikawa*
Affiliation:
Kanazawa Institute of Technology, Office of Industry-University Collaboration, 7-1 Nonoichi, Ishikawa 921-8501, Japan
Masahiro Taniguchi
Affiliation:
Department of Applied Chemistry, Kanazawa Institute of Technology, 7-1 Nonoichi, Ishikawa 921-8501, Japan
*
*Corresponding author.[email protected]
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Abstract

In 1994, a new type of atom probe instrument, named the scanning atom probe (SAP), was proposed. The unique feature of the SAP is the introduction of a small extraction electrode, which scans over a specimen surface and confines the high field, required for field evaporation of surface atoms in a small space, between the specimen and the electrode. Thus, the SAP does not require a sharp specimen tip. This indicates that the SAP can mass analyze the specimens which are difficult to form in a sharp tip, such as organic materials and biomolecules. Clean single wall carbon nanotubes (CNT), made by high-pressure carbon monoxide process are found to be the best substrates for biomolecules. Various amino acids and dipeptide biomolecules were successfully mass analyzed, revealing characteristic clusters formed by strongly bound atoms in the specimens. The mass analysis indicates that SAP analysis of biomolecules is not only qualitative, but also quantitative.

Keywords

Scanning atom probe (SAP)biomoleculeamino aciddipeptidecarbon nano tube (CNT)binding statequantitative-qualitative analysis
Type
New Approaches and Correlative Microscopy
Information
Microscopy and Microanalysis , Volume 23 , Special Issue 2: Atom Probe Tomography & Microscopy 2016 , April 2017 , pp. 336 - 339
Copyright
© Microscopy Society of America 2016 

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References

Binnig, G., Rohrer, H., Gerber, Ch. & Weibel, E. (1983). 7×7 reconstruction on Si(111) resolved in real space. Phys Rev Lett. 50, 120–123.CrossRefGoogle Scholar
Cerezo, A. & Smith, G.D.W. (2001). Field Ion Microscopy: Atom Probe Microanalysis, Encyclopedia of Materials, vol. 4, Oxford, Elsevier.Google Scholar
Müller, E.W., Panitz, J.A. & McLane, S.B. (1968). The atom-probe field ion microscope. Rev Sci Instrum 39, 83–86.Google Scholar
Nishikawa, O., Kurihara, K., Nachi, M., Konishi, M. & Wada, M. (1981). Performance of the new high mass resolution time of flight atom probe. Rev Sci Instrum 52, 810–818.Google Scholar
Nishikawa, O., Kaneda, O., Shibata, M. & Nomura, E. (1984). Atom-probe study of Al-Ga exchange reaction at Al-GaAs interfaces. Phys Rev Lett 53, 1252–1255.CrossRefGoogle Scholar
Nishikawa, O. & Kimoto, M. (1994). Toward a scanning atom probe—computer simulation of electric field. Appl Surf Sci 76/77, 424–430.Google Scholar
Nishikawa, O., Masahiro Taniguchi, M. & Ikai, A. (2009). Atomic level analysis of biomolecules by the scanning atom probe. Appl Surf Sci 256, 1210–1213.Google Scholar
Nishikawa, O., Murakami, T., Watanabe, M., Taniguchi, M., Kuzumaki, T. & Kondo, S. (2003). Atomic level analysis of carbon and silicon by a scanning atom probe. Jpn J Appl Phys 42, 4816–4824.Google Scholar
Nishikawa, O., Ohtani, Y., Maeda, K., Watanabe, M. & Tanaka, K. (2000). Development of the scanning atom probe and atomic level analysis. Mater Charact 44, 29–57.CrossRefGoogle Scholar
Nishikawa, O. & Taniguchi, M. (2005). Atom-by-atom analysis of non-metallic materials by the scanning atom probe. Chinese J Phys 43(I–II), 111–123.Google Scholar
Nishikawa, O., Taniguchi, M. & Saito, Y. (2008). Study of characteristic fragmentation of nanocarbon by the scanning atom probe. J Vac Sci Technol A 26, 1074–1078.CrossRefGoogle Scholar
Nishikawa, O., Taniguchi, M., Watanabe, S., Yamagishi, A. & Sasaki, T. (2006). Scanning atom probe study of dissociation of organic molecules on titanium oxides. Jpn J Appl Phys 45(3B), 1892–1896.CrossRefGoogle Scholar