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Toward Quantitative Bright Field TEM Imaging of Ultra Thin Samples

Published online by Cambridge University Press:  01 August 2018

Takashi Fujii ,
Marek Malac ,
Emi Kano ,
Misa Hayashida ,
Toshie Yaguchi  and
Ray Egerton
Takashi Fujii
Affiliation:
Hitachi High-Technologies Corp., Hitachinaka-shi, Ibaraki-ken, Japan.
Marek Malac
Affiliation:
NRC-NANO, Edmonton, Canada. Department of Physics, University of Alberta, Edmonton, Canada.
Emi Kano
Affiliation:
NRC-NANO, Edmonton, Canada. Department of Physics, University of Alberta, Edmonton, Canada.
Misa Hayashida
Affiliation:
NRC-NANO, Edmonton, Canada.
Toshie Yaguchi
Affiliation:
Hitachi High-Technologies Corp., Hitachinaka-shi, Ibaraki-ken, Japan.
Ray Egerton
Affiliation:
Department of Physics, University of Alberta, Edmonton, Canada.

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1612 - 1613
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Cui, K., et al, Microscopy research and technique 80(8 p. 823.Google Scholar
[2] Zhang, H-R., et al, Micron 43(1 p. 8.Google Scholar
[3] Egerton, R. F. EELS in the TEM, 3rd ed Springer Verlag 2011.Google Scholar