Hostname: page-component-586b7cd67f-tf8b9 Total loading time: 0 Render date: 2024-11-29T23:55:01.231Z Has data issue: false hasContentIssue false
  • English
  • Français

Toward Deterministic Switching in Ferroelectric Systems: Insight Gained from In Situ TEM

Published online by Cambridge University Press:  23 September 2015

James Hart ,
Michael Jablonski ,
Andrew Lang ,
Anoop Damadoran ,
Shi Liu ,
Miryam Arredondo ,
Lane W. Martin ,
Andrew Rappe  and
Mitra L. Taheri
James Hart
Affiliation:
Drexel University, Department of Materials Science & Engineering, Philadelphia, PA, USA
Michael Jablonski
Affiliation:
Drexel University, Department of Materials Science & Engineering, Philadelphia, PA, USA
Andrew Lang
Affiliation:
Drexel University, Department of Materials Science & Engineering, Philadelphia, PA, USA
Anoop Damadoran
Affiliation:
University of California-Berkeley, Department of Materials Science & Engineering, Berkeley, CA, U.SA
Shi Liu
Affiliation:
University of Pennsylvania, Department of Chemistry, Philadelphia, PA, USA
Miryam Arredondo
Affiliation:
Queens University, Centre for Nanostructured Media (CNM), Belfast, United Kingdom
Lane W. Martin
Affiliation:
University of California-Berkeley, Department of Materials Science & Engineering, Berkeley, CA, U.SA
Andrew Rappe
Affiliation:
University of Pennsylvania, Department of Chemistry, Philadelphia, PA, USA
Mitra L. Taheri
Affiliation:
Drexel University, Department of Materials Science & Engineering, Philadelphia, PA, USA

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1347 - 1348
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Winkler, C.R., et al, Nano Letters 14(6) (2014). p 3617.Google Scholar
[2] Winkler, C.R., et al, Journal of Applied Physics 112 (2012). p 052013.Google Scholar
[3] Winkler, C.R., et al, Micron 43 (2012). p 1121.Google Scholar
[4] The authors acknowledge funding from the Office of Naval Research under contract number N000141410058.Google Scholar