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Topics in Electron Diffraction (TEM): A Tutorial

Published online by Cambridge University Press:  02 July 2020

J. A. Eades
J. A. Eades*
Affiliation:
Department of Materials Science and Engineering, Lehigh University, Bethlehem, PA
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Abstract

Introduction. Electron diffraction is sometimes considered to be a “difficult subject”. It is certainly one that can not be covered in the space available here. Rather this tutorial will present a few specific aspects of the topic. The topics have been chosen in the hope that they will provide illumination that spreads more widely than just onto the material presented. Several books treat electron diffraction with more generality.

Kikuchi lines Kikuchi lines are of great use in orienting a sample. Unfortunately, in modern microscopes, Kikuchi lines are not seen in selected-area diffraction (SAD). This is because immersion lenses send parallel electrons, from different parts of the sample (like the Kikuchi lines from a flat specimen), to different places in the diffraction pattern. Thus Kikuchi lines are blurred and generally not useful whenever, as in SAD patterns, a large area of the sample contributes to the diffraction pattern.

Type
Tutorials (Biological Sciences Tutorials Organized by G. Sosinsky) (Physical Sciences Tutorials Organized by I. Anderson)
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 764 - 765
Copyright
Copyright © Microscopy Society of America 2001

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References

References.

1.Williams, D. B. and Carter, C. B., Transmission Electron Microscopy, Plenum (New York 1996) Spence, J. C. H. and Zuo, J. M., Electron Microdiffraction, Plenum (New York 1992) Cowley, J. M. (Ed.) Electron Diffraction Techniques (2 volumes) Oxford (Oxford 1992)CrossRefGoogle Scholar
2.Christenson, K. K. and Eades, J. A., Skew Thoughts on Parallelism Ultramicroscopy 26(1988) 113–132CrossRefGoogle Scholar
3.Cowley, J. M., Diffraction Physics, North Holland (Amsterdam, 1981) Chapter 12, 249–271Gjonnes, J., Disorder and defect scattering, thermal diffuse scattering, and amorphous material, in Cowley, J. M. (Ed.) Electron Diffraction Techniques Oxford (1992) Volume 2, 223-259Google Scholar
4.Support from DOE, under grant DE-FG02-00ER45819, is gratefully acknowledgedGoogle Scholar