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tomviz: Providing Advanced Electron Tomography by Streamlining Alignment, Reconstruction, and 3D Visualization

Published online by Cambridge University Press:  04 August 2017

Yi Jiang ,
Elliot Padgett ,
Marcus D. Hanwell ,
Cory Quammen ,
Chris Harris ,
Shawn Waldon ,
David A. Muller  and
Robert Hovden
Yi Jiang
Affiliation:
Department of Physics, Cornell University, Ithaca, NY, USA
Elliot Padgett
Affiliation:
School of Applied & Engineering Physics, Cornell University, Ithaca, NY, USA
Marcus D. Hanwell
Affiliation:
Kitware, Inc., Clifton Park, NY, USA
Cory Quammen
Affiliation:
Kitware, Inc., Clifton Park, NY, USA
Chris Harris
Affiliation:
Kitware, Inc., Clifton Park, NY, USA
Shawn Waldon
Affiliation:
Kitware, Inc., Clifton Park, NY, USA
David A. Muller
Affiliation:
School of Applied & Engineering Physics, Cornell University, Ithaca, NY, USA Kavli Institute at Cornell for Nanoscale Science, Ithaca, NY, USA
Robert Hovden
Affiliation:
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, MI, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 222 - 223
Copyright
© Microscopy Society of America 2017 

References

[1] De Rosier, D. & Klug, A. Nature 217 1968). p. 130–134.Google Scholar
[2] Midgley, P.A., et al, Chemical Communications 10 2001). p. 907–908.CrossRefGoogle Scholar
[3] Sidky, E., et al, Physics in medicine and biology 53 2008). p. 4777–4807.CrossRefGoogle Scholar
[4] Hanwell, M.D., et al, SoftwareX 1–2, 9–12, 2015.Google Scholar
[5] Levin, B., et al, Scientific Data 3 2016.Google Scholar
[6] tomviz is supported from DOE Office of Science contract DE-SC0011385.Google Scholar