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Tomographic Imaging with Single Atom Sensitivity Using Aberration-Corrected STEM

Published online by Cambridge University Press:  01 August 2005

K van Benthem ,
A R Lupini ,
Y Peng  and
S J Pennycook
K van Benthem
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
A R Lupini
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
Y Peng
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee
S J Pennycook
Affiliation:
Oak Ridge National Laboratory, Oak Ridge, Tennessee

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 318 - 319
Copyright
© 2005 Microscopy Society of America