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Time Resolved SEM-SXES Analysis for Lithium Material

Published online by Cambridge University Press:  30 July 2020

Yasuaki Yamamoto
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Takanori Murano
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Hiroshi Onodera
Affiliation:
JEOL Ltd., Akishima, Tokyo, Japan
Natasha Erdman
Affiliation:
JEOL USA Inc., Peabody, Massachusetts, United States
Reiko Matsuda
Affiliation:
Toyohashi University of Technology, Toyohashi, Aichi, Japan
Atsunori Matsuda
Affiliation:
Toyohashi University of Technology, Toyohashi, Aichi, Japan

Abstract

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Type
X-ray, Electron and Synchrotron-Based X-ray Imaging and Analysis
Copyright
Copyright © Microscopy Society of America 2020

References

Terauchi, M. et al. , Journal of Electron Microscopy, Volume 61, (2012), P. 1810.1093/jmicro/dfr076CrossRefGoogle Scholar
Takahashi, H. et al. , Microscopy and Microanalysis 22(S3):422423 (2016)10.1017/S1431927616002968CrossRefGoogle Scholar
Yamamoto, Y. et al. , Microscopy and Microanalysis 24(S1):10621063(2018)10.1017/S1431927618005792CrossRefGoogle Scholar