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Three-Dimensional X-Ray Imaging and Analysis of Fungi on and in Wood

Published online by Cambridge University Press:  27 August 2009

Jan Van den Bulcke ,
Matthieu Boone ,
Joris Van Acker  and
Luc Van Hoorebeke
Jan Van den Bulcke*
Affiliation:
Laboratory of Wood Technology, Faculty of Bioscience Engineering, Ghent University, Coupure Links 653, 9000 Gent, Belgium
Matthieu Boone
Affiliation:
Department for Subatomic and Radiation Physics, Faculty of Sciences, Ghent University, Proeftuinstraat 86, 9000 Gent, Belgium
Joris Van Acker
Affiliation:
Laboratory of Wood Technology, Faculty of Bioscience Engineering, Ghent University, Coupure Links 653, 9000 Gent, Belgium
Luc Van Hoorebeke
Affiliation:
Department for Subatomic and Radiation Physics, Faculty of Sciences, Ghent University, Proeftuinstraat 86, 9000 Gent, Belgium
*
Corresponding author. E-mail: [email protected]
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Abstract

As wood is prone to fungal degradation, fundamental research is necessary to increase our knowledge aiming at product improvement. Several imaging modalities are capable of visualizing fungi, but the X-ray equipment presented in this article can envisage fungal mycelium in wood nondestructively in three dimensions with submicron resolution. Four types of wood subjected to the action of the white rot fungus Coriolus versicolor (Linnaeus) Quélet (CTB 863 A) were scanned using an X-ray-based approach. Comparison of wood volumes before and after fungal exposure, segmented manually or semiautomatically, showed the presence of the fungal mass on and in the wood samples and therefore demonstrated the usefulness of computed X-ray tomography for mycological and wood research. Further improvements to the experimental setup are necessary to resolve individual hyphae and enhance segmentation.

Keywords

X-raywoodfungus3Dimagingcomputed tomography (CT)
Type
Tomography Applications
Information
Microscopy and Microanalysis , Volume 15 , Issue 5 , October 2009 , pp. 395 - 402
Copyright
Copyright © Microscopy Society of America 2009

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