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Three-Dimensional Organization of Tight Junctions Investigated by TEM and STEM Tomography

Published online by Cambridge University Press:  01 August 2005

A E Yakushevska ,
W J C Geerts ,
B M Humbel ,
A J Verkleij  and
A J Koster
A E Yakushevska
Affiliation:
Utrecht University,The Netherlands
W J C Geerts
Affiliation:
Utrecht University,The Netherlands
B M Humbel
Affiliation:
Utrecht University,The Netherlands
A J Verkleij
Affiliation:
Utrecht University,The Netherlands
A J Koster
Affiliation:
Utrecht University,The Netherlands

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 342 - 343
Copyright
© 2005 Microscopy Society of America