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Three-Dimensional Evaluation of a Multi-Walled Carbon Nanotube Probe by Using High-Resolution Transmission Electron Microscope

Published online by Cambridge University Press:  01 August 2010

T Tanigaki
Affiliation:
Hitachi High-Tech Manufacturing & Service Co
Y Nagakubo
Affiliation:
Hitachi High-Technologies Co
K Hidaka
Affiliation:
Hitachi, Ltd

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Copyright
Copyright © Microscopy Society of America 2010