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Three-dimensional Charge Density and Electric Field Mapping of an Electrically Biased Needle Using Off-axis Electron Holography

Published online by Cambridge University Press:  30 July 2020

Fengshan Zheng ,
Vadim Migunov ,
Jan Caron ,
Hongchu Du ,
Giulio Pozzi  and
Rafal Dunin-Borkowski
Fengshan Zheng
Affiliation:
Forschungszentrum Juelich, Juelich, Nordrhein-Westfalen, Germany
Vadim Migunov
Affiliation:
Forschungszentrum Juelich, Juelich, Nordrhein-Westfalen, Germany
Jan Caron
Affiliation:
Forschungszentrum Juelich, Juelich, Nordrhein-Westfalen, Germany
Hongchu Du
Affiliation:
Forschungszentrum Juelich, Juelich, Nordrhein-Westfalen, Germany
Giulio Pozzi
Affiliation:
Università di Bologna, Bologna, Emilia-Romagna, Italy
Rafal Dunin-Borkowski
Affiliation:
Forschungszentrum Juelich, Juelich, Nordrhein-Westfalen, Germany

Abstract

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Type
Direct Phase Imaging with Coherent Electron Beam in TEM
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1540 - 1542
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Copyright
Copyright © Microscopy Society of America 2020

References

Sze, S.M., Semiconductor devices: physics and technology, Wiley, 2008.Google Scholar
Zhang, H., et al. , Nat. Nanotech. 11 (2016) 273.10.1038/nnano.2015.276CrossRefGoogle Scholar
Vurpillot, F., et al. , Ultramicroscopy. 159 (2015) 202.10.1016/j.ultramic.2014.12.013CrossRefGoogle Scholar
Su, Y., et al. , Nat. Nanotech. 11 (2016) 609.10.1038/nnano.2016.30CrossRefGoogle Scholar
Lichte, H., et al. , Rep. Prog. Phys. 71 (2007) 016102.10.1088/0034-4885/71/1/016102CrossRefGoogle Scholar
Zheng, F., et al. , J. Elec. Spec. Rel. Phenom. 2020, in press.Google Scholar
The authors acknowledge the European Union for funding through the Marie Curie Initial Training Network Grant No. 606988 under FP7-PEOPLE-2013-ITN).Google Scholar