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Three-Dimensional Characterization of Magnetic Tunnel Junctions for Read Head Applications by Atom-Probe Tomography

Published online by Cambridge University Press:  01 August 2010

DK Schreiber ,
Y-S Choi ,
Y Liu ,
DN Seidman  and
AK Petford-Long
DK Schreiber
Affiliation:
Northwestern University
Y-S Choi
Affiliation:
Canon ANELVA Corporation, Japan
Y Liu
Affiliation:
Argonne National Laboratory
DN Seidman
Affiliation:
Northwestern University
AK Petford-Long
Affiliation:
Northwestern University

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 1912 - 1913
Copyright
Copyright © Microscopy Society of America 2010