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Three Dimensional Ultrastructural Analysis of CNS Axons Using Serial Ion-Abrasion Scanning Electron Microscopy (SIA-SEM)

Published online by Cambridge University Press:  01 August 2010

G Kidd ,
A Avishai ,
N Ohno ,
X Yin ,
N Avishai ,
A Heuer  and
B Trapp
G Kidd
Affiliation:
Cleveland Clinic Foundation
A Avishai
Affiliation:
Case Western Reserve University
N Ohno
Affiliation:
Cleveland Clinic Foundation
X Yin
Affiliation:
Cleveland Clinic Foundation
N Avishai
Affiliation:
Case Western Reserve University
A Heuer
Affiliation:
Case Western Reserve University
B Trapp
Affiliation:
Cleveland Clinic Foundation

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 16 , Supplement S2 , July 2010 , pp. 188 - 189
Copyright
Copyright © Microscopy Society of America 2010