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Three Dimensional Microstructural Characterization of Cathode Degradation in SOFCs Using FIB/SEM and TEM

Published online by Cambridge University Press:  23 September 2015

Joshua Taillon ,
Christopher Pellegrinelli ,
Yilin Huang ,
Eric Wachsman  and
Lourdes Salamanca-Riba
Joshua Taillon
Affiliation:
University of Maryland, Materials Science and Engineering, College Park, MD, USA
Christopher Pellegrinelli
Affiliation:
University of Maryland, Materials Science and Engineering, College Park, MD, USA
Yilin Huang
Affiliation:
University of Maryland, Materials Science and Engineering, College Park, MD, USA
Eric Wachsman
Affiliation:
University of Maryland, Materials Science and Engineering, College Park, MD, USA
Lourdes Salamanca-Riba
Affiliation:
University of Maryland, Materials Science and Engineering, College Park, MD, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2161 - 2162
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Gostovic, D, et al, Journal of the American Ceramic Society 94 (2011). p. 620.CrossRefGoogle Scholar
[2] Smith, JR, et al, Solid State Ionics 180 (2009). p. 90.CrossRefGoogle Scholar
[3] Gommes, CJ, et al, AIChE Journal 55 (2009). p. 2000.CrossRefGoogle Scholar
[4] The authors gratefully acknowledge funding from the U.S. DOE, SECA contract DEF SEE0009084. JAT additionally acknowledges funding through the NSF GRFP, grant DGE 1322106..Google Scholar