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Three Dimensional Accurate Morphology Measurements of Polystyrene Standard Particles on Silicon Substrate by Electron Tomography

Published online by Cambridge University Press:  23 September 2015

Misa Hayashida
Affiliation:
National Institute for Nanotechnology (NINT), Edmonton, Alberta, Canada
Kazuhiro Kumagai
Affiliation:
National Institute of Advanced Industrial Science and Technology (AIST), Tsukuba, Ibaraki, Japan
Marek Malac
Affiliation:
National Institute for Nanotechnology (NINT), Edmonton, Alberta, Canada Department of Physics, University of Alberta, Edmonton, Alberta, Canada

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

Reference:

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[2] Hayashida, M., Malac, M., Bergen, M. & Li, P., Ultramicroscopy Vol. 144 (2014) 5057.Google Scholar
[3] Bergen, M., et. al., Microscopy and Microanalysis 19(S2 (2013) 13941395.CrossRefGoogle Scholar