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Texture and Phase Analysis in Nanocrystalline Ni Thin Films by Precession Electron Diffraction Microscopy

Published online by Cambridge University Press:  23 September 2015

Szu-Tung Hu ,
Lauren Morganti ,
Shreyas Rajasekhara ,
Khalid Hattar  and
Paulo Ferreira
Szu-Tung Hu
Affiliation:
Materials Science and Engineering, University of Texas at Austin, Austin TX, USA
Lauren Morganti
Affiliation:
Materials Science and Engineering, University of Texas at Austin, Austin TX, USA
Shreyas Rajasekhara
Affiliation:
Sandia National Laboratories, Albuquerque, NM, USA
Khalid Hattar
Affiliation:
Sandia National Laboratories, Albuquerque, NM, USA
Paulo Ferreira
Affiliation:
Materials Science and Engineering, University of Texas at Austin, Austin TX, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1457 - 1458
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Kobler, A., et al, Ultramicroscopy 128 (2013), p. 68–81.Google Scholar
[2] Rajasekhara, S., et al, Scripta Materialia 67 (2012), p. 189–192.Google Scholar
[3] Acknowledgments: This work was fully supported by the Division of Materials Science and Engineering, Office of Basic Energy Sciences, US Department of Energy. Sandia National Laboratories is a multi-program laboratory operated by Sandia Corporation, a wholly owned subsidiary of Lockheed Martin Company, for the US Department of Energy's National Nuclear Security Administration under contract DE-AC04-94AL85000.Google Scholar