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Temporal Compressive Sensing Instrumentation for TEM

Published online by Cambridge University Press:  04 August 2017

Daniel J. Masiel ,
Ruth S. Bloom ,
Sang Tae Park  and
Bryan W. Reed
Daniel J. Masiel
Affiliation:
Integrated Dynamic Electron Solutions, Inc, Pleasanton United States of America
Ruth S. Bloom
Affiliation:
Integrated Dynamic Electron Solutions, Inc, Pleasanton United States of America
Sang Tae Park
Affiliation:
Integrated Dynamic Electron Solutions, Inc, Pleasanton United States of America
Bryan W. Reed
Affiliation:
Integrated Dynamic Electron Solutions, Inc, Pleasanton United States of America

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 20 - 21
Copyright
© Microscopy Society of America 2017 

References

[1] Reed, B W, et al Microsc. Microanal. (2016) submitted.Google Scholar
[2] Stevens, A., et al Adv. Struct. Chem. Imaging (2015) pi.Google Scholar