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Temperature Measurement in a TEM using Electron Diffraction of Amorphous Films

Published online by Cambridge University Press:  04 August 2017

Misa Hayashida ,
Kai Cui  and
Marek Malac
Misa Hayashida
Affiliation:
National Institute for Nanotechnology 11421 Saskatchewan Drive, Edmonton, T6G 2M9, Canada
Kai Cui
Affiliation:
National Institute for Nanotechnology 11421 Saskatchewan Drive, Edmonton, T6G 2M9, Canada
Marek Malac
Affiliation:
National Institute for Nanotechnology 11421 Saskatchewan Drive, Edmonton, T6G 2M9, Canada Department of Physics, University of Alberta, Edmonton, T6G 2E1, Canada

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 950 - 951
Copyright
© Microscopy Society of America 2017 

References

[1] Winterstein, Jonathan P., et al, Ultramicroscopy Microsc. Microanal. 21, 1622–1628, 2015.CrossRefGoogle Scholar
[2] Niekiel, Florian, et al Ultramicroscopy (in press).Google Scholar