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TEM Video Compressive Sensing

Published online by Cambridge University Press:  23 September 2015

Andrew Stevens ,
Libor Kovarik ,
Patricia Abellan ,
Xin Yuan ,
Lawrence Carin  and
Nigel D. Browning
Andrew Stevens
Affiliation:
Pacific Northwest National Laboratory, {NSD, EMSL, EMSL, FCSD}, Richland USA Duke University, ECE, Durham USA
Libor Kovarik
Affiliation:
Pacific Northwest National Laboratory, {NSD, EMSL, EMSL, FCSD}, Richland USA
Patricia Abellan
Affiliation:
Pacific Northwest National Laboratory, {NSD, EMSL, EMSL, FCSD}, Richland USA
Xin Yuan
Affiliation:
Duke University, ECE, Durham USA
Lawrence Carin
Affiliation:
Duke University, ECE, Durham USA
Nigel D. Browning
Affiliation:
Pacific Northwest National Laboratory, {NSD, EMSL, EMSL, FCSD}, Richland USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 1583 - 1584
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Llull, P, Liao, X, Yuan, X, et al, Optics Express 21(9), (2013). p 10526.CrossRefGoogle Scholar
[2] Yuan, X, Yang, J, Llull, P, et al, In ICIP 2013. (IEEE), p 14.Google Scholar
[3] Yang, J, Yuan, X, Liao, X, et al, Imagke Processing, IEEE Transactions on 23(11), (2014). p 4863.CrossRefGoogle Scholar
[4] Yuan, X, Llull, P, Liao, X, et al, In CVPR 2014. (IEEE), p 3318.Google Scholar
[5] Candes, EJ, Romberg, J & Tao, T. Information Theory. IEEE Transactions on 52(2), (2006). p 489.Google Scholar
[6] Binev, P, Dahmen, W, DeVore, R, et al., In Modeling Nanoscale Imaging in Electron Microscopy. eds T Vogt, W Dahmen & P Binev, (Springer, US), Nanostructure Science and Technology (2012). p. 73.Google Scholar
[7] Stevens, A, Yang, H, Carin, L, et al, Microscopy 63(1), (2014). pp 41.CrossRefGoogle Scholar
[8] This work was supported in part by US DOE Grant No. DE-FG02-03ER46057. This research is also part of the Chemical Imaging & Signature Discovery Initiatives conducted under the LDRD Program at Pacific Northwest National Laboratory (PNNL) and used EMSL, a national scientific user facility sponsored by the DOE Office of Bio & Env. Research at PNNL. PNNL is a multi-program national lab operated by Battelle Memorial Institute under Contract DE-AC05-76RL01830 for the US DOE.Google Scholar