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TEM Studies of Disorder-Order Transition in the Acid-Catalyzed Growth of Mesoscopic Silica Thin Films

Published online by Cambridge University Press:  02 July 2020

N. Yao ,
A. Y. Ku ,
D. A. Saville  and
I. A. Aksay
N. Yao
Affiliation:
Princeton Materials Institute, Princeton, NJ08544-5263
A. Y. Ku
Affiliation:
Princeton Materials Institute, Princeton, NJ08544-5263 Department of Chemical Engineering, Princeton University, Princeton, NJ08544-5263
D. A. Saville
Affiliation:
Princeton Materials Institute, Princeton, NJ08544-5263 Department of Chemical Engineering, Princeton University, Princeton, NJ08544-5263
I. A. Aksay
Affiliation:
Princeton Materials Institute, Princeton, NJ08544-5263 Department of Chemical Engineering, Princeton University, Princeton, NJ08544-5263
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Abstract

Mesoscopic silica is synthesized by using a self-assembling organic species to direct the structure of an inorganic matrix. It has attracted much interest because of its potential for use in a wide variety of catalysis, separations and nanotechnology applications. The commercial success of this material depends on the ability to simultaneously tailor the channel size and organization. A more complete understanding of the mechanism by which the material forms should lead to improved control over the structure. Small angle X-ray diffraction studies have shown that there is an “induction period” which precedes the observation of well-packed channels in films grown at the air-water interface. However, scattering data alone are unable to establish how the development of order might occur. Direct observation of the evolution is necessary to determine the mechanism by which well-packed, nanometer-sized channels form.

Continuous mesoporous silica thin films were grown at the air-water interface.

Type
Thin Films & Coatings
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 1226 - 1227
Copyright
Copyright © Microscopy Society of America 2001

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References

References:

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