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TEM of nanodot arrays fabricated by direct laser interferometry

Published online by Cambridge University Press:  02 July 2020

Y. Liu ,
M. Zheng ,
M. Yu ,
R. Skomski ,
S. H. Liou ,
N. I. Polushkin  and
D. J. Sellmyer
Y. Liu
Affiliation:
Center for Materials Research and Analysis, University of Nebraska, Lincoln, NE, 68588
M. Zheng
Affiliation:
Center for Materials Research and Analysis, University of Nebraska, Lincoln, NE, 68588
M. Yu
Affiliation:
Center for Materials Research and Analysis, University of Nebraska, Lincoln, NE, 68588
R. Skomski
Affiliation:
Center for Materials Research and Analysis, University of Nebraska, Lincoln, NE, 68588
S. H. Liou
Affiliation:
Center for Materials Research and Analysis, University of Nebraska, Lincoln, NE, 68588
N. I. Polushkin
Affiliation:
Center for Materials Research and Analysis, University of Nebraska, Lincoln, NE, 68588
D. J. Sellmyer
Affiliation:
Center for Materials Research and Analysis, University of Nebraska, Lincoln, NE, 68588
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Abstract

Patterned nanostructures and nanodots are attracting increasing interest in the information storage industry. The ultimate recording density of a magnetic medium will have single domain dots aligned in arrays and each dot in such an array acts as a recording bit. The ideal structure is that the dots are magnetic and the surrounding medium is non-magnetic so that each dot can switch magnetization direction freely without the interference from other dots. This paper presents the nanostructure of the nano-dot array investigated by transmission electron microscopy and magnetic force microscopy. The Co:C film was deposited by alternatively sputtering Co target and C target. The as-deposited specimen has an amorphous structure as revealed by electron diffraction in TEM. Such films transform to ferro-magnetic ones after heat treatment [1]. A laser beam of wavelength of 308 nm and a flux of 0.24 J/cm2 was split into two beams of an approximately equal intensity and then recombined, generating an interference pattern and a periodic modulation of the light intensity.

Type
Applications of Microscopy: Surfaces/Interfaces
Information
Microscopy and Microanalysis , Volume 7 , Issue S2: Proceedings: Microscopy & Microanalysis 2001, Microscopy Society of America 59th Annual Meeting, Microbeam Analysis Society 35th Annual Meeting, Long Beach, California August 5-9, 2001 , August 2001 , pp. 316 - 317
Copyright
Copyright © Microscopy Society of America 2001

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References

This research is supported by CMRA and NSF grant 25-0521-0054-001.Google Scholar

1. Yu, M., Liu, Y., and Sellmyer, D. J., J. Appl. Phys., Vol. 85, 4319–4321 (1999).CrossRefGoogle Scholar

2. Zheng, M., Yu, M., Liu, Y., Skomski, R., Liou, S. H., and Sellmyer, D. J. et al. sub. to J. Appl.Physics.Google Scholar