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TEM investigations of Ga(Sb,As) quantum dots grown on a seed layer of (In,Ga)As quantum dots

Published online by Cambridge University Press:  05 September 2003

I. Häusler ,
H. Kirmse ,
R. Otto ,
W. Neumann ,
L. Müller-Kirsch ,
D. Bimberg ,
M. Lentzen  and
K. Urban
I. Häusler
Affiliation:
Humboldt-Universität zu Berlin, Institut für Physik, AG Kristallographie, Newtonstraße 15, 12489 Berlin, Germany
H. Kirmse
Affiliation:
Humboldt-Universität zu Berlin, Institut für Physik, AG Kristallographie, Newtonstraße 15, 12489 Berlin, Germany
R. Otto
Affiliation:
Humboldt-Universität zu Berlin, Institut für Physik, AG Kristallographie, Newtonstraße 15, 12489 Berlin, Germany
W. Neumann
Affiliation:
Humboldt-Universität zu Berlin, Institut für Physik, AG Kristallographie, Newtonstraße 15, 12489 Berlin, Germany
L. Müller-Kirsch
Affiliation:
Technische Universität Berlin, Institut für Festkörperphysik, Hardenbergstraße 36, 10623 Berlin, Germany
D. Bimberg
Affiliation:
Technische Universität Berlin, Institut für Festkörperphysik, Hardenbergstraße 36, 10623 Berlin, Germany
M. Lentzen
Affiliation:
Institut für Festkörperforschung, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
K. Urban
Affiliation:
Institut für Festkörperforschung, Forschungszentrum Jülich GmbH, 52425 Jülich, Germany
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Abstract

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Type
Invited Papers
Information
Microscopy and Microanalysis , Volume 9 , Issue S03 , September 2003 , pp. 212 - 213
Copyright
Copyright © Microscopy Society of America 2003

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