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TEM In-Situ Electrical Testing of a FIB-prepared BaTiO3 Ceramic Base Metal Electrode Capacitor

Published online by Cambridge University Press:  27 August 2014

Zachary Lingley ,
Talin Ayvazian ,
Jesse Theiss ,
Miles Brodie  and
Brendan Foran
Zachary Lingley
Affiliation:
The Aerospace Corporation, 2310 E. El Segundo Blvd., El Segundo, CA 90245-4691
Talin Ayvazian
Affiliation:
The Aerospace Corporation, 2310 E. El Segundo Blvd., El Segundo, CA 90245-4691
Jesse Theiss
Affiliation:
The Aerospace Corporation, 2310 E. El Segundo Blvd., El Segundo, CA 90245-4691
Miles Brodie
Affiliation:
The Aerospace Corporation, 2310 E. El Segundo Blvd., El Segundo, CA 90245-4691
Brendan Foran
Affiliation:
The Aerospace Corporation, 2310 E. El Segundo Blvd., El Segundo, CA 90245-4691

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 20 , Supplement S3: Proceedings of Microscopy & Microanalysis 2014 , August 2014 , pp. 1654 - 1655
Copyright
Copyright © Microscopy Society of America 2014 

References

[1] Yang, GY et al, Journal of Applied Physics 96 (2004), p. 7492.Google Scholar
[2] Mecklenburg, M et al, Microscopy and Microanalysis 19 (2013) p. 458.Google Scholar
[3] Krishnan, A et al, Materials Research Society Symposium Proceedings 541 (1998), p. 475.Google Scholar
[4] Kishi, H et al, Japanese Journal of Applied Physics 42 (2003), p. 1.Google Scholar
[5] This work was supported in part through The Aerospace Corporation’s Internal Research and Development Program.Google Scholar