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TEM FIB Lift-Out of Mount Saint Helens Volcanic Ash

Published online by Cambridge University Press:  02 July 2020

J.L. Drown-MacDonald ,
B.I. Prenitzer ,
T.L. Shofner  and
L.A. Giannuzzi
J.L. Drown-MacDonald
Affiliation:
Advanced Materials Processing and Analysis Center, Mechanical Materials + Aerospace Engineering, University of Central Florida, 4000 Central Florida Blvd., Orlando, FL32816–2450.
B.I. Prenitzer
Affiliation:
Advanced Materials Processing and Analysis Center, Mechanical Materials + Aerospace Engineering, University of Central Florida, 4000 Central Florida Blvd., Orlando, FL32816–2450.
T.L. Shofner
Affiliation:
Advanced Materials Processing and Analysis Center, Mechanical Materials + Aerospace Engineering, University of Central Florida, 4000 Central Florida Blvd., Orlando, FL32816–2450.
L.A. Giannuzzi
Affiliation:
Advanced Materials Processing and Analysis Center, Mechanical Materials + Aerospace Engineering, University of Central Florida, 4000 Central Florida Blvd., Orlando, FL32816–2450.
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Focused Ion Beam (FIB) specimen preparation for both scanning and transmission electron microscopy (SEM and TEM respectively) has seen an increase in usage over the past few years. The advantage to the FIB is that site specific cross sections (or plan view sections) may be fabricated quickly and reproducibly from numerous types of materials using a finely focused beam of Ga+ ions [1,2]. It was demonstrated by Prenitzer et al. that TEM specimens may be acquired from individual Zn powder particles by employing the FIB LO specimen preparation technique [3]. In this paper, we use the FIB LO technique to prepare TEM specimens from Mount Saint Helens volcanic ash.

Volcanic ash from Mount Saint Helens was obtained at the Microscopy and Microanalysis 1998 meeting in Atlanta. TEM analysis of the ash was performed using the FIB lift out technique [1]. Ash powders were dusted onto an SEM sample stud that had been coated with silver paint.

Type
Precision Specimen Preparation
Information
Microscopy and Microanalysis , Volume 5 , Issue S2: Proceedings: Microscopy & Microanalysis '99, Microscopy Society of America 57th Annual Meeting, Microbeam Analysis Society 33rd Annual Meeting, Portland, Oregon August 1-5, 1999 , August 1999 , pp. 908 - 909
Copyright
Copyright © Microscopy Society of America

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References

1.Giannuzzi, et al., Mat. Res. Soc. Symp. Proc. Vol. 480, (1997), 19.CrossRefGoogle Scholar
2.Giannuzzi, et al., Microscopy Research and Technique, 41 (1998) 285.3.0.CO;2-Q>CrossRefGoogle ScholarPubMed
3.Prenitzer, et al., Metallurgical and Materials Transactions A., SEP 01(1998) v 29 n 9, P. 2399.CrossRefGoogle Scholar
4.Sedlacek, et al., NASA Conf Publ 1982. NASA p 83.Google Scholar
5. We thank the support of DOD NDSEG fellowship contract number P-34862-RT-NDF, NSF DMR #9703281, and the I4-UCF/Cirent PartnershipGoogle Scholar