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TEM Characterization of Thin, Epitactic Ni2MnGa films on GaAs.

Published online by Cambridge University Press:  01 November 2002

S. McKernan ,
J. W. Dong  and
C. J. Palmstrøm
S. McKernan
Affiliation:
Department of Chemical Engineering and Materials Science, Amundson Hall, University of Minnesota, Minneapolis, Minnesota 55455
J. W. Dong
Affiliation:
Department of Chemical Engineering and Materials Science, Amundson Hall, University of Minnesota, Minneapolis, Minnesota 55455
C. J. Palmstrøm
Affiliation:
Department of Chemical Engineering and Materials Science, Amundson Hall, University of Minnesota, Minneapolis, Minnesota 55455

Abstract

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Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 302 - 303
Copyright
Copyright © Microscopy Society of America 2002