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TEM Characterization of the Deformed Region Beneath Knoop Indents in Boron Carbide

Published online by Cambridge University Press:  25 July 2016

S. D. Walck ,
J. C. LaSalvia  and
K. D. Behler
S. D. Walck
Affiliation:
TKC Global, RDRL-WMM-C, Aberdeen Proving Ground, MD 21005, USA
J. C. LaSalvia
Affiliation:
U.S. Army Research Laboratory, RDRL-WMM-E, Aberdeen Proving Ground, MD 21005, USA
K. D. Behler
Affiliation:
TKC Global, RDRL-WMM-E, Aberdeen Proving Ground, MD 21005, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 1880 - 1881
Copyright
© Microscopy Society of America 2016 

References

References:

[1] Madhav Reddy, K., et al., Nature Communications 10(1038 (2013). p. 3483.Google Scholar
[2] Brennan, C.V, Walck, S.D & Swab, J. J. Microscopy and Microanalysis 20(6 (2014). p. 1646.Google Scholar
[3] Swab, J. J., et al., Microscopy and Microanalysis 21(S3 (2015). p. 315.Google Scholar
[4] The research reported in this document was performed in connection with contract/instrument W911QX-14-C-0016 with the U.S. Army Research Laboratory. The views and conclusions contained in this document are those of TKC Global and the U.S. Army Research Laboratory.Google Scholar