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TEM Characterization of Self-Assembled Magnetic Nanowires

Published online by Cambridge University Press:  01 August 2002

X. Zhao ,
Y. Liu ,
M. Zheng ,
Z. Hao ,
S. Bandyopadhay  and
D. Sellmyer
X. Zhao
Affiliation:
CLAIM, Department of Mechanical Eng. University of Michigan, Ann Arbor, MI 48109-2125
Y. Liu
Affiliation:
CLAIM, Department of Mechanical Eng. University of Michigan, Ann Arbor, MI 48109-2125 Center for Materials Research and Analysis University of Nebraska, Lincoln, NE 68588
M. Zheng
Affiliation:
Center for Materials Research and Analysis University of Nebraska, Lincoln, NE 68588
Z. Hao
Affiliation:
Center for Materials Research and Analysis University of Nebraska, Lincoln, NE 68588
S. Bandyopadhay
Affiliation:
Center for Materials Research and Analysis University of Nebraska, Lincoln, NE 68588
D. Sellmyer
Affiliation:
Center for Materials Research and Analysis University of Nebraska, Lincoln, NE 68588

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1368 - 1369
Copyright
Copyright © Microscopy Society of America 2002