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TEM and Optical Studies of Ni/NiO Nanoparticles in Ni-ion-implanted Al2O3

Published online by Cambridge University Press:  01 August 2005

X T Zu
Affiliation:
University of Electronic Science and Technology of China
S Zhu
Affiliation:
University of Michigan
X Xiang
Affiliation:
University of Electronic Science and Technology of China
L Wang
Affiliation:
University of Michigan

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Copyright
© 2005 Microscopy Society of America