Hostname: page-component-586b7cd67f-rdxmf Total loading time: 0 Render date: 2024-11-28T08:13:48.743Z Has data issue: false hasContentIssue false
  • English
  • Français

TEM and Atom Probe Microscopy in the Development of Magnetic Multilayer Nano-Structures

Published online by Cambridge University Press:  21 July 2003

P. M. Rice ,
T. Lin ,
R. E. Fontana Jr  and
E. A. Delenia
P. M. Rice
Affiliation:
IBM Almaden Research Center, 650 Harry Road, San Jose CA, 9512
T. Lin
Affiliation:
Hitachi Global Storage Technology, 650 Harry Road, San Jose, CA 9512
R. E. Fontana Jr
Affiliation:
Hitachi Global Storage Technology, 650 Harry Road, San Jose, CA 9512
E. A. Delenia
Affiliation:
IBM Almaden Research Center, 650 Harry Road, San Jose CA, 9512

Abstract

An abstract is not available for this content so a preview has been provided. As you have access to this content, a full PDF is available via the ‘Save PDF’ action button.
Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 572 - 573
Copyright
Copyright © Microscopy Society of America 2003