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Synthetic and natural Reference materials for EPMA, LA-ICPMS, LA-MC-ICPMS, SIMS, and Spectroscopic Microanalysis

Published online by Cambridge University Press:  04 August 2017

John M. Hanchar
John M. Hanchar*
Affiliation:
Department of Earth Sciences, Memorial University of Newfoundland, St. John’s, NL A1B 3X5Canada

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 508 - 509
Copyright
© Microscopy Society of America 2017 

References

[1] Hanchar, JM, Finch, RJ, Hoskin, PWO, Watson, EB, Cherniak, DJ & Mariano, AN American Mineralogist 86 2001). p 667–680.CrossRefGoogle Scholar
[2] Mikova, J, Kosler, J, Longerich, HP, Wiedenbeck, M & Hanchar, JM Journal of Analytical Atomic Spectrometry 24 2009 1244–1252. doi: 10.1039/b900276f.Google Scholar