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Surface and Electric Field Imaging by Newly Designed Atomic-Resolution STEM

Published online by Cambridge University Press:  01 August 2018

Ryo Ishikawa ,
Naoya Shibata  and
Yuichi Ikuhara
Ryo Ishikawa
Affiliation:
Institute of Engineering Innovation, University of Tokyo, Tokyo, Japan
Naoya Shibata
Affiliation:
Institute of Engineering Innovation, University of Tokyo, Tokyo, Japan Nanostructured Research Laboratory, Japan Fine Ceramics Center, Nagoya, Japan.
Yuichi Ikuhara
Affiliation:
Institute of Engineering Innovation, University of Tokyo, Tokyo, Japan Nanostructured Research Laboratory, Japan Fine Ceramics Center, Nagoya, Japan.

Abstract

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Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 118 - 119
Copyright
© Microscopy Society of America 2018 

References

[1] Ishikawa, R., et al, Ultramicroscopy 151, 122 2015.Google Scholar
[2] Ishikawa, R., et al, Appl. Phys. Lett. 109, 163102 2016.Google Scholar
[3] Morishita, S., et al, Microscopy 67, 46 2018.Google Scholar
[4] Shibata, N., et al, Nat Phys 8, 611 2012.Google Scholar
[5] Shibata, N., et al, Nat Commun 7, 15631 2017.Google Scholar
[6] A part of this work was supported by the Research & Development Initiative for Scientific Innovation of New Generation Batteries (RISING2)..Google Scholar