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Supervised Component Analysis for EELS Mapping

Published online by Cambridge University Press:  04 August 2017

Shixin Wang
Shixin Wang*
Affiliation:
Micron Technology, Inc., Boise, ID, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 198 - 199
Copyright
© Microscopy Society of America 2017 

References

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