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Super-resolution imaging of nanostructures by solving the phase problem with over-sampling of diffraction patterns

Published online by Cambridge University Press:  16 July 2003

J.M. Zuo ,
I. Vartanyants ,
M. Gao ,
L.A. Nagahara  and
R. Zhang
J.M. Zuo
Affiliation:
Department of Materials Science and Engineering and Materials Research Laboratory, University of Illinois at Urbana-Champaign, IL 61801
I. Vartanyants
Affiliation:
Department of Physics and Materials Research Laboratory, University of Illinois at Urbana- Champaign, IL 61801
M. Gao
Affiliation:
Department of Materials Science and Engineering and Materials Research Laboratory, University of Illinois at Urbana-Champaign, IL 61801
L.A. Nagahara
Affiliation:
Physical Sciences Research Laboratories, Motorola Labs, 7700 South River Parkway, Tempe AZ 85284
R. Zhang
Affiliation:
Physical Sciences Research Laboratories, Motorola Labs, 7700 South River Parkway, Tempe AZ 85284

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 942 - 943
Copyright
Copyright © Microscopy Society of America 2003