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Superconducting Nano Wire Circuits Fabricated using a Focused Helium Beam

Published online by Cambridge University Press:  23 September 2015

E. Y. Cho
Affiliation:
Oxide Nano Electronics Laboratory, Department of Physics, University of California, San Diego, La Jolla, California USA.
Meng K. Ma
Affiliation:
Oxide Nano Electronics Laboratory, Department of Physics, University of California, San Diego, La Jolla, California USA.
Chuong Huynh
Affiliation:
Carl Zeiss Microscopy, LLC., Peabody, Massachusetts USA
R. C. Dynes
Affiliation:
Oxide Nano Electronics Laboratory, Department of Physics, University of California, San Diego, La Jolla, California USA.
Shane A. Cybart
Affiliation:
Oxide Nano Electronics Laboratory, Department of Physics, University of California, San Diego, La Jolla, California USA.

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

Refrences

[1] Valles, J. M. Jr, et al. ""Ion-beam-induced metal-insulator transition in Y Ba 2 Cu 3 O 7-8: A mobility edge.". Physical Review B 39.16 (1989) 11599.CrossRefGoogle Scholar
[2] SRIM, the stopping and range of ions in matter (2008) by J. F. Ziegler, J. P. Biersack, Matthias D. Ziegler..Google Scholar
[3] Cybart, Shane A., et al., "Nano Josephson Superconducting Tunnel Junctions in Y-Ba-Cu-O Direct-Patterned with a Focused Helium Ion Beam." arXiv preprint arXiv 1409, 4876 (2014).Google Scholar