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Sub-Ångstrom EDX Mapping Enabled by a High-brightness Cold Field Emission Source

Published online by Cambridge University Press:  30 July 2020

Berit Goodge ,
Anna Carlsson ,
Maarten Bischoff ,
Ali Mohammadi-Gheidari ,
Gamal Fallag ,
Greg Schwind ,
Christian Maunders ,
David Muller  and
Lena Kourkoutis
Berit Goodge
Affiliation:
Cornell University, Ithaca, New York, United States
Anna Carlsson
Affiliation:
Thermo Fisher Scientific, Eindhoven, Noord-Brabant, Netherlands
Maarten Bischoff
Affiliation:
Thermo Fisher Scientific, Eindhoven, Noord-Brabant, Netherlands
Ali Mohammadi-Gheidari
Affiliation:
Thermo Fisher Scientific, Eindhoven, Noord-Brabant, Netherlands
Gamal Fallag
Affiliation:
Thermo Fisher Scientific, Eindhoven, Noord-Brabant, Netherlands
Greg Schwind
Affiliation:
BeamTech, Hillsboro, Oregon, United States
Christian Maunders
Affiliation:
Thermo Fisher Scientific, Eindhoven, Noord-Brabant, Netherlands
David Muller
Affiliation:
Cornell University, Ithaca, New York, United States
Lena Kourkoutis
Affiliation:
Cornell University, Ithaca, New York, United States

Abstract

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Type
Pushing the Limits of Detection in Quantitative (S)TEM Imaging, EELS, and EDX
Information
Microscopy and Microanalysis , Volume 26 , Supplement S2 , August 2020 , pp. 1508 - 1511
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Copyright
Copyright © Microscopy Society of America 2020

References

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Supported by PARADIM, an NSF-MIP (DMR-1539918), with additional support by NSF (DMR-1429155, DMR-1719875). DyScO3 sample provided by D. G. Schlom (Cornell University).Google Scholar