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Study Using Low-loss EELS to Compare Properties of TMDs Produced by Mechanical and Liquid Phase Exfoliation

Published online by Cambridge University Press:  23 September 2015

Hannah C Nerl
Affiliation:
CRANN & AMBER, Trinity College Dublin, Dublin 2, Ireland and School of Physics, Trinity College Dublin, Dublin 2, Ireland
Fredrik S Hage
Affiliation:
SuperSTEM Laboratory, STFC Daresbury Campus, Keckwick Lane, Daresbury WA4 4AD, UK
Lothar Houben
Affiliation:
Ernst Ruska Center for Microscopy and Spectroscopy with Electrons, Research Center Julich, Germany
Quentin M Ramasse
Affiliation:
SuperSTEM Laboratory, STFC Daresbury Campus, Keckwick Lane, Daresbury WA4 4AD, UK
Valeria Nicolosi
Affiliation:
CRANN & AMBER, Trinity College Dublin, Dublin 2, Ireland and School of Physics, Trinity College Dublin, Dublin 2, Ireland School of Chemistry, Trinity College Dublin, Dublin 2, Ireland

Abstract

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Type
Abstract
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Geim, AK & Novoselov, KS Nature Materials 6 (2007) p. 183.Google Scholar
[2] Bergin, SD, et al Advanced Materials 20 10 (2008) p. 1876.Google Scholar
[3] Hernandez, Y, et al, Nat. Nanotechnol 3 (2008) p. 563.Google Scholar
[4] Coleman, JN, et al Science 331 (2011) p. 568.CrossRefGoogle Scholar
[5] Chhowalla, M, et al. Nat. Chem 5 (2013) p. 263.Google Scholar
[6] Nicolosi, V, et al Science 340 (2013) p. 1226419.Google Scholar
[7] Geim, AK Science 324 (2009) p. 1530.Google Scholar
[8] Novoselov, KS, et al Nature 490 (2012) p. 192.Google Scholar
[9] Wang, QH, et al. Nat. Nanotechnol 7 (2012) p. 699.Google Scholar
[10] Osada, M & Sasaki, T J. Mater. Chem 19 (2009) p. 2503.CrossRefGoogle Scholar
[11] Krivanek, OL, et al Nature 464 (2010) p. 571.Google Scholar
[12] Krivanek, OL, et al Microscopy (Oxf) 62 1 (2013) p. 3.Google Scholar
[13] Backes, C, et al Nat. Comm 5 (2014) p. 4576.Google Scholar
[14] Disko, M.M., et al Ultramicroscopy 23 (1987) p. 313.Google Scholar
[15] SuperSTEM is the UK National Facility for aberration-corrected STEM, funded by the UK EPSRC.Google Scholar