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Study on the barriers in magnetic tunnel junctions by electron holography

Published online by Cambridge University Press:  19 July 2003

F. Shen ,
T. Zhu ,
X. Xiang ,
John Q. Xiao  and
Z. Zhang
F. Shen
Affiliation:
Beijing Laboratory of Electron Microscopy
T. Zhu
Affiliation:
State Key Laboratory for Magnetism, Institute of Physics, Chinese Academy of Sciences, Beijing 100080, China
X. Xiang
Affiliation:
Department of Physics and Astronomy, University of Delaware, Newark, Delaware 19716
John Q. Xiao
Affiliation:
Department of Physics and Astronomy, University of Delaware, Newark, Delaware 19716
Z. Zhang*
Affiliation:
Beijing Laboratory of Electron Microscopy
*
1Author to whom correspondence should be addressed; electronic mail address: [email protected]

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 9 , Issue S02 , August 2003 , pp. 312 - 313
Copyright
Copyright © Microscopy Society of America 2003