Hostname: page-component-586b7cd67f-t7czq Total loading time: 0 Render date: 2024-11-28T17:53:08.844Z Has data issue: false hasContentIssue false

A Study of the Cleaning Effectiveness of the Evactron(R) RF Plasma System on a Scanning Electron Microscope

Published online by Cambridge University Press:  01 August 2005

R Garcia
Affiliation:
NC State University, North Carolina
A Batchelor
Affiliation:
NC State University, North Carolina
C Mooney
Affiliation:
NC State University, North Carolina
K Bunker
Affiliation:
NC State University, North Carolina
D Griffis
Affiliation:
NC State University, North Carolina
V Carlino
Affiliation:
XEI Scientific, Redwood City, California
R Vane
Affiliation:
XEI Scientific, Redwood City, California
P Russell
Affiliation:
NC State University, North Carolina

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Copyright
© 2005 Microscopy Society of America