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Study of Helium-Ion-Beam-Generated Defects in a Monolayer WS2 Using Aberration-Corrected Scanning Transmission Electron Microscopy

Published online by Cambridge University Press:  01 August 2018

Taeho Roy Kim ,
Cory Cress ,
Jose Fonseca Vega ,
Todd Brintlinger ,
Jeremy Robinson  and
Rhonda Stroud
Taeho Roy Kim
Affiliation:
NRC Postdoctoral Associate, U.S. Naval Research Laboratory, Washington, DC, USA.
Cory Cress
Affiliation:
Electronics Science and Technology Division, U.S. Naval Research Laboratory, Washington, DC, USA.
Jose Fonseca Vega
Affiliation:
NRC Postdoctoral Associate, U.S. Naval Research Laboratory, Washington, DC, USA.
Todd Brintlinger
Affiliation:
Materials Science and Technology Division, U.S. Naval Research Laboratory, Washington, DC, USA.
Jeremy Robinson
Affiliation:
Electronics Science and Technology Division, U.S. Naval Research Laboratory, Washington, DC, USA.
Rhonda Stroud
Affiliation:
Materials Science and Technology Division, U.S. Naval Research Laboratory, Washington, DC, USA.

Abstract

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Information
Microscopy and Microanalysis , Volume 24 , Supplement S1: Proceedings of Microscopy & Microanalysis 2018 , August 2018 , pp. 1596 - 1597
Copyright
© Microscopy Society of America 2018 

References

References:

[1] Manzeli, S., et al, Nat. Rev. Mater. 2 2017) p. 17033.Google Scholar
[2] Lin, Z., et al, 2D Mater 3 2016) p. 22002.Google Scholar
[3] Komsa, H.-P., et al, Phys. Rev. Lett. 109 2012) p. 35503.Google Scholar
[4] Salvatore, G.A., et al, ACS Nano. 7 2013) p. 8809.Google Scholar
[5] Ahn, Y., et al, Mater. Express. 6 2016) p. 69.Google Scholar
[6] The authors acknowledge funding from the Office of Naval Research (Naval Research Laboratory Basic Research Program). T. R. Kim and J. Fonseca Vega acknowledge National Research Council for the Research Associate Award.Google Scholar