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Structure-Property Relationships in Sputtered Magneto-Optic Multilayers

Published online by Cambridge University Press:  02 July 2020

R. Sinclair ,
G. A. Bertero  and
M.R. Visokay
R. Sinclair
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA94305
G. A. Bertero
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA94305
M.R. Visokay
Affiliation:
Department of Materials Science and Engineering, Stanford University, Stanford, CA94305
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Extract

One technology for high-density information storage employs magneto-optic thin films. Key material properties include a large magneto-optic Kerr rotation of polarized light (especially in the blue wavelength range), high perpendicular magnetic anisotropy, good reflectivity and a large magnetic coercivity. These can be achieved in nano-scale magnetic multilayers (e.g., Co-Pt) in which one of the constituent layers is ferromagnetic. Naturally the magnetic properties can be manipulated to a great extent by the preparation conditions, and the microstructure is most readily revealed by cross-section high-resolution electron microscopy (HREM). In our work, extremely high quality multilayers were fabricated by sputtering using a variety of inert gases, and most notably the influence of interface sharpness on properties was assessed. Intermetallic compounds, which are essentially “natural” multilayers, were also extensively studied.

Figure 1 shows magneto-optic Kerr rotation hysteresis loops for multilayers sputtered in 5 mtorr of either argon or the heavier xenon gas.

Type
Nanocrystals and Nanocomposites: Novel Structures For Catalysis, Electronics, and Micromechanics
Information
Microscopy and Microanalysis , Volume 3 , Issue S2: Proceedings: Microscopy & Microanalysis '97, Microscopy Society of America 55th Annual Meeting, Microbeam Analysis Society 31st Annual Meeting, Histochemical Society 48th Annual Meeting, Cleveland, Ohio, August 10-14, 1997 , August 1997 , pp. 397 - 398
Copyright
Copyright © Microscopy Society of America 1997

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References

Bertero, G. A. and Sinclair, R., Appl. Phys. Lett. 64(1994)3337.10.1063/1.111271CrossRefGoogle Scholar
Visokay, M. R. and Sinclair, R., Appl. Phys. Lett. 66(1995) 1692.10.1063/1.113895CrossRefGoogle Scholar
Funding for this work was kindly provided by Kobe Steel Company.Google Scholar