Hostname: page-component-cd9895bd7-lnqnp Total loading time: 0 Render date: 2024-12-26T20:35:24.386Z Has data issue: false hasContentIssue false

Structural Quality of GaSb/GaAs Quantum Dots for Solar Cells Analyzed by Electron Microscopy Techniques

Published online by Cambridge University Press:  14 March 2016

N. Fernández-Delgado
Affiliation:
Department of Material Science, Metallurgical Engineering and Inorganic Chemistry, University of Cádiz, 11510, Puerto Real, Cádiz, Spain.
M. Herrera
Affiliation:
Department of Material Science, Metallurgical Engineering and Inorganic Chemistry, University of Cádiz, 11510, Puerto Real, Cádiz, Spain.
N. Baladés
Affiliation:
Department of Material Science, Metallurgical Engineering and Inorganic Chemistry, University of Cádiz, 11510, Puerto Real, Cádiz, Spain.
J. S. James
Affiliation:
Physics Department, Lancaster University, Lancaster, LA1 4YB, UK.
A. Krier
Affiliation:
Physics Department, Lancaster University, Lancaster, LA1 4YB, UK.
H. Fujita
Affiliation:
Magnetic Sensors Process Technology & Development Department, Asahi-Kasei Microdevices, Japan.
S. I. Molina
Affiliation:
Department of Material Science, Metallurgical Engineering and Inorganic Chemistry, University of Cádiz, 11510, Puerto Real, Cádiz, Spain.

Abstract

Image of the first page of this content. For PDF version, please use the ‘Save PDF’ preceeding this image.'
Type
Material Sciences
Copyright
Copyright © Microscopy Society of America 2016 

References

[1]Nozik, A., Physica E 14 (2002). p. 115.Google Scholar
[2]Carrington, P. J., Wagener, M. C., Botha, J. R., Sanchez, A. M. & Krier, A., Appl. Phys. Lett 101 (2012) 231101.Google Scholar
[3]Carrington, P. J., Mahajumi, A. S., Wagener, M. C., Botha, J. R., Zhuang, Q. & Krier, A., Physica 407 (2012). p. 1493.Google Scholar
[4]Chou, S. K., Yang, W. M., Chua, K. J., Li, J. & Zhang, K. L., Applied Energy 91 (2012). p. 304.Google Scholar
[5]Tang, L., Ye, H. & Xu, J., Solar En. Mat. & Solar Cells 122 (2014). p. 94.Google Scholar
[6]Laghumavarapu, B., Moscho, A., Khoshakhlagh, A., El-Emawy, M., Lester, L. F. & Huffaker, D. L., Appl. Phys. Lett 90 (2007), 173125.Google Scholar
[7]Schaller, R. D. & Klimov, V.I., Phys. Rev. Lett 92 (2004) 186601.Google Scholar
[8]Lopatin, S., Pennycook, S. J., Narayan, J. & Duscher, G., Appl. Phys. Lett 81 (2002). p. 15.Google Scholar
[9]Rocher, A. M., Solid State Phenom 19/20 (1991). p. 363.Google Scholar
[10]Mancini, L., Fotana, Y., Conesa-Boj, S., Blum, I., Vurpillot, F., Francavigilia, L., Russo-Averchi, E., Heiss, M., Arbiol, J., Fontcuberta, M. I. & Rigutti, L., Appl. Phys. Lett 105 (2014) 4904952.Google Scholar