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Structural Characterization of Pt-Bi Thin Films Deposited by Electron Beam Evaporation

Published online by Cambridge University Press:  08 April 2017

X Li ,
P Kharel ,
V Shah  and
D Sellmyer
X Li
Affiliation:
University of Nebraska
P Kharel
Affiliation:
University of Nebraska
V Shah
Affiliation:
University of Nebraska
D Sellmyer
Affiliation:
University of Nebraska

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1446 - 1447
Copyright
Copyright © Microscopy Society of America 2011