Hostname: page-component-cd9895bd7-jn8rn Total loading time: 0 Render date: 2024-12-28T04:55:21.236Z Has data issue: false hasContentIssue false
  • English
  • Français

Structural Characterization of Pt-Bi Thin Films Deposited by Electron Beam Evaporation

Published online by Cambridge University Press:  08 April 2017

X Li ,
P Kharel ,
V Shah  and
D Sellmyer
X Li
Affiliation:
University of Nebraska
P Kharel
Affiliation:
University of Nebraska
V Shah
Affiliation:
University of Nebraska
D Sellmyer
Affiliation:
University of Nebraska

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

Type
Abstract
Information
Microscopy and Microanalysis , Volume 17 , Supplement S2 , July 2011 , pp. 1446 - 1447
Copyright
Copyright © Microscopy Society of America 2011