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Structural and Magnetic Characterization of B20 Skyrmion Thin Films and Heterostructures Using Aberration-Corrected Lorentz TEM and Differential Phase Contrast STEM

Published online by Cambridge University Press:  04 August 2017

B. D. Esser ,
A. S. Ahmed ,
R. K. Kawakami  and
D. W. McComb
B. D. Esser
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH, USA
A. S. Ahmed
Affiliation:
Department of Physics, The Ohio State University, Columbus, OH, USA
R. K. Kawakami
Affiliation:
Department of Physics, The Ohio State University, Columbus, OH, USA
D. W. McComb
Affiliation:
Center for Electron Microscopy and Analysis, The Ohio State University, Columbus, OH, USA

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 1732 - 1733
Copyright
© Microscopy Society of America 2017 

References

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[1] Langner, M. C., et al, Physical Review Letters 112, 167202 2014.Google Scholar
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[3] Milde, P., et al, Science 340, 1076 2013.Google Scholar
[4] Woo, S., et al, Nature Materials 15, 501–506, 2016.Google Scholar
[5] Ahmed, A. S., et al., arXiv:1702.05191 (2017).Google Scholar
[6] Funding for this research was provided by the Center for Emergent Materials at the Ohio State University, an NSF MRSEC (Award Number DMR-1420451), as well as from the Ohio State Materials Seed Grants (MTB-G00010 and MTB-G00012).Google Scholar