Hostname: page-component-586b7cd67f-2plfb Total loading time: 0 Render date: 2024-11-28T10:45:21.732Z Has data issue: false hasContentIssue false
  • English
  • Français

A Strategy for Selective Low Vacuum Imaging and Focused Ion Beam Milling of Multi-Layer Optoelectronic Polymer Devices

Published online by Cambridge University Press:  01 August 2005

D J Stokes ,
C M Ramsdale ,
H Mulders  and
A M Donald
D J Stokes
Affiliation:
University of Cambridge, United Kingdom
C M Ramsdale
Affiliation:
Plastic Logic Ltd, Cambridge, United Kingdom
H Mulders
Affiliation:
FEI Company, The Netherlands
A M Donald
Affiliation:
University of Cambridge, United Kingdom

Extract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the ‘Save PDF’ action button.

Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 386 - 387
Copyright
© 2005 Microscopy Society of America