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Strategies for Obtaining High Spatial Resolution in Imaging and Spectroscopy of Beam-sensitive TEM Specimens

Published online by Cambridge University Press:  25 July 2016

R.F. Egerton
R.F. Egerton*
Affiliation:
Department of Physics, University of Alberta, Edmonton, T6G 2E1Canada

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 22 , Supplement S3: Proceedings of Microscopy & Microanalysis 2016 , July 2016 , pp. 302 - 303
Copyright
© Microscopy Society of America 2016 

References

[1] Erni, R “Aberration-Corrected Imaging in Transmission Electron Microscopy”, 2nd edition (2015) (Imperial College Press, London) ISNB: 978-1-78326-528-2.Google Scholar
[2] Egerton, RF Ultramicroscopy 159 (2015). p. 95.CrossRefGoogle Scholar
[3] Egerton, RF Ultramicroscopy 145 (2014). p. 85.Google Scholar
[4] Egerton, RF Microscopy Research and Technique 75 (2012). p. 1550.Google Scholar
[5] The author thanks the Natural Sciences and Engineering Research Council of Canada for funding.Google Scholar