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Strain Mapping of Interfaces by Quantitative High-Resolution TEM

Published online by Cambridge University Press:  01 August 2005

C L Johnson  and
Y Zhu
C L Johnson
Affiliation:
Brookhaven National Laboratory, Upton New York
Y Zhu
Affiliation:
Brookhaven National Laboratory, Upton New York

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2005 in Honolulu, Hawaii, USA, July 31--August 4, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 11 , Issue S02 , August 2005 , pp. 574 - 575
Copyright
© 2005 Microscopy Society of America