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Strain Estimation by Electron Back Scattered Diffraction

Published online by Cambridge University Press:  02 July 2020

T. Baudin
Affiliation:
Universite’ de Paris Sud, Laboratoire de Metallurgie Structurale, URA CNRS 1107, Batiment 413, 91405, Orsay Cedex
Y. Chastel
Affiliation:
Ecole des Mine de Paris, Centre de Mise en Forme des Materiaux, URA CNRS 1374, Sophia-Antipolis, rue Claude Daunesse, BP 207, 06904, Sophia, Antipolis Cedex
R. Pennelle
Affiliation:
Universite’ de Paris Sud, Laboratoire de Metallurgie Structurale, URA CNRS 1107, Batiment 413, 91405, Orsay Cedex
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Extract

The quality of the Kikuchi patterns obtained for example by electron backscattered diffraction decreases when the dislocation density increases in strained materials, and consequently, it can theoretically be correlated to the strain through the average dislocation density measurement particularly for monotonic deformation paths. For that purpose, in a first step it is necessary to define a quality factor defined in the Hough space or with the Burns method currently used when the Kikuchi patterns are automatically analyzed. Then, and it is the most important point, the quality factor must be linked to the strain through a calibration curve independent of crystallographic orientation.

The main objective of this study is to test the reliability of this method in the simple case of the hardness test. This test is simulated using the finite element method and the obtained results are compared to those measured by electron backscattered diffraction. Several calibration methods are defined.

Type
Materials Science Applications of Microdiffraction Methods in the SEM
Copyright
Copyright © Microscopy Society of America 1997

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